# An Outline of a Research Strategy

#### Current interests include such topics as

transport and electric
properties of monocrystalline and polycrystalline materials, including
thin films

effect of surface modification
on charge carrier kinetics

shallow traps in various
types of semiconductors

the effect of dopants
on the energy and density subband gap states

The main instrumental method is the Advanced Method of Transient
Microwave Photoconductivity (AMTMP). This method permits simultaneous
measurement of changes in a cavity resonance frequency and a quality
factor after sample illumination. These changes are proportional
to changes in a real and in imaginary parts of dielectric constant
according to a cavity perturbation theory. Usually (but not always)
conduction electrons cause a change in a material conductivity
related to a change of cavity quality factor (photoconductivity).
Trapped electrons cause a change in the real part of dielectric
constant related to a shift of a resonance frequency (photodielectric
effect).As a result, this unique registers both free and trapped
electron kinetics.

AMTMP, experimental

AMTMP, theory

Microwave Response due to Light Induced Changes in the Complex Dielectric Constant of Semiconductors

Multiple trapping rate
equation simulation for various distributions of localized states
in the band gap

Experimental results

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